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锥形半导体 器研究进展

孙胜明,范杰,徐莉,邹永刚,杨晶晶,龚春阳

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孙胜明, 范杰, 徐莉, 邹永刚, 杨晶晶, 龚春阳. 锥形半导体 器研究进展[J]. , 2019, 12(1): 48-58. doi: 10.3788/CO.20191201.0048
引用本文: 孙胜明, 范杰, 徐莉, 邹永刚, 杨晶晶, 龚春阳. 锥形半导体 器研究进展[J]. , 2019, 12(1): 48-58.doi:10.3788/CO.20191201.0048
SUN Sheng-ming, FAN Jie, XU Li, ZOU Yong-gang, YANG Jing-jing, GONG Chun-yang. Progress of tapered semiconductor diode lasers[J]. Chinese Optics, 2019, 12(1): 48-58. doi: 10.3788/CO.20191201.0048
Citation: SUN Sheng-ming, FAN Jie, XU Li, ZOU Yong-gang, YANG Jing-jing, GONG Chun-yang. Progress of tapered semiconductor diode lasers[J].Chinese Optics, 2019, 12(1): 48-58.doi:10.3788/CO.20191201.0048

锥形半导体 器研究进展

doi:10.3788/CO.20191201.0048
基金项目:

吉林省科技发展计划项目20180519018JH

吉林省科技发展计划项目20190302052GX

吉林省教育厅"十三五"科学技术项目JJKH20190543KJ

长春理工大学科技创新基金XJJLG-2016-07

详细信息
    作者简介:

    孙胜明(1991-), 男, 山东聊城人, 硕士研究生, 主要从事光电子技术与应用方面的研究。E-mail:sunshengming23@163.com

    范杰(1982—),男,吉林延边人,博士,助理研究员,2007年于吉林大学获得硕士学位,2013年于电子科技大学获得博士学位,主要从事光电子技术与应用方面的研究。E-mail:fanjie@cust.edu.cn

  • 中图分类号:TN248

Progress of tapered semiconductor diode lasers

Funds:

Jilin Science and Technology Development Plan20180519018JH

Jilin Science and Technology Development Plan20190302052GX

Jilin Education Department "135" Science and TechnologyJJKH20190543KJ

the Innovation Science Foundation of Changchun University of Science and TechnologyXJJLG-2016-07

More Information
  • 摘要:锥形半导体 器具有高功率、高光束质量等特点,因此受到广泛关注并成为研究热点。从3种结构(传统结构、分布式布拉格反射(DBR)结构、侧向光栅条纹结构)的锥形半导体 器出发,对国内外近十年具有代表性研究成果进行综述,介绍其理论研究和实验进展,并对锥形半导体 器的未来发展进行展望。

  • 图 1锥形半导体 器样貌图[10]

    Figure 1.Schematic of the tapered lasers[10]

    图 2器件的阈值电流密度随温度的变化[12]

    Figure 2.Plot of the threshold current density versus temperature[12]

    图 3980 nm锥形 器在不同输出功率时和不同驱动方式时的光束质量因子[13]

    Figure 3.Dependence of the beam propagation ratioM2on the output power for common separate contacting[13]

    图 4不同外延设计的输出功率和光束质量因子M2的关系[18]

    Figure 4.Beam propagation factorM2with the outputpower for different epitaxial designs and experimental value for the symmetric structure[18]

    图 5PCB层结构的锥形半导体 器结构示意图[21]

    Figure 5.Schematic of the tapered lasers based on longitudinal PBC structure[21]

    图 6折射率分布和横向模式强度分布[21]

    Figure 6.Refractive index distribution and calculated mode profiles[21]

    图 74种不同锥角大小结构的P-I-V曲线图[23]

    Figure 7.Data for four different waveguide structures of the devices in a CW mode at room temperature[23]

    图 80°、3°、5°、8°Thz锥形半导体 器电镜图[24]

    Figure 8.SEM image of the tapered THz QCL with tapered angles equal to 0°, 3°, 5° and 8°[24]

    图 93A锥形区电流条件下,不同主振荡器电流条件(0、150、300 mA)的传统锥形 器和DBR锥形 器的近场强度、远场强度分布[26]

    Figure 9.Near-and far-fields intensity for different RW(0、150、300 mA) currents at a taper current of 3 A[26]

    图 101 060 nm锥形半导体 器结构示意图[28]

    Figure 10.Cross-sectional schematic of the 1 060 nm DBR tapered laser[28]

    图 111 030 nm锥形半导体 器结构示图[30]

    Figure 11.Lateral layout of the presented 1 030 nm DBR tapered diode laser[30]

    图 123种不同DBR锥形半导体 器设计[32]

    Figure 12.Illustrations of the lateral layouts for DBR tapered diode lasers[32]

    图 13DBR光栅加热电极[33]

    Figure 13.Heater contact pads for DBR grating[33]

    图 14913 nm双锥形半导体 器结构示意图[35]

    Figure 14.Schematical picture of the device. The scanning electron microscope map(inset) shows the ridge waveguide and the HOSGs on both sides of it[35]

    图 15主振荡器侧向条纹锥形半导体 器结构示意图[36]

    Figure 15.Schematic diagram of a tapered THz QCL with lateral gratings[36]

    图 16带有侧向Cr金属光栅的DFB锥形半导体 器结构示意图[37]

    Figure 16.Schematic diagram of laterally tapered ridge waveguide InGaAsP-InGaAsP MQW DFB lasers with Cr surface gratings[37]

    图 1725 ℃和55 ℃条件下,器件光谱图[38]

    Figure 17.Spectral characteristic of the device at 25 ℃ and 55 ℃ heatsink temperature[38]

    表 13种锥形半导体 器性能

    Table 1.Properties of three kinds tapered laser diode structures

    器件结构 出光功率 M2因子 最大亮度 加工工艺
    传统[14-16] W级 较大, 较不稳定 460 MW·cm-2sr-1 较简单
    DBR[27-28] 10W级 较小, 稳定 700 MW·cm-2sr- 较复杂
    侧向光栅条纹[23] mW级 较小 偏小 较简单
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  • 收稿日期:2018-01-29
  • 修回日期:2018-03-03
  • 刊出日期:2019-02-01

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