Anti-radiation techniques for CCD remote sensing cameras
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摘要:空间辐射环境是遥感相机失效的主要原因之一。为了提高CCD遥感相机的可靠性,本文研究了改善遥感电子器件抗辐射性能的方法。介绍了空间辐射环境,指出太阳活动、宇宙射线、范艾伦辐射带以及次级辐射是产生辐射危害的主要来源。分别从辐射总剂量、单粒子和位移效应分析了空间辐射对不同电子器件和集成电路造成的危害。针对遥感CCD相机,从CCD器件、集成电路和大规模可编程门阵列(FPGA)3方面提出了相应的抗辐射策略,并进行了抗辐射总剂量和抗单粒子的抗辐射验证试验。本文的研究为提高遥感CCD相机的抗辐射能力和可靠性提供了保障。Abstract:The radiation environment is one of the reasons for the invalidation of CCD remote sensing cameras. In order to improve reliability of the cameras, anti-radiation techniques for electronic devices in CCD cameras were researched. The space radiation enviroment was introduced, then it points out that the solar activity, cosmic ray, Van Allent Belt and the secondary radiation are main sources of the radiation damage. Based on the study of space radiation environment, the radiation damage especially caused by Total Ionizing Dose(TID), Single Event Effect(SEE) and Displacement Damage(DD) on the electronic devices and integrated circuits was analyzed, respectively. Focused on the CCD camera, the anti-radiation tactics were proposed for CCD devices, integrated circuits and FPGA aspects. In the end, validating experiments for anti-radiation TID and anti-radiation SEE were carried out. Results demonstrate that this research provides some methods to increase the anti-radiation ability and improve the reliability of CCD remote sensing cameras.
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