Volume 5Issue 3
Jun. 2012
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MO Wei-dong, FAN Qi, JIA Jin-chao, ZHANG Hai-fang, FENG Ming-de, YANG Bai-yu, LI Jun-sheng. Determination of optimum positions of incident spherical wave and reference spherical wave in testing aspheric surface[J]. Chinese Optics, 2012, 5(3): 263-269. doi: 10.3788/CO.20120503.0263
Citation: MO Wei-dong, FAN Qi, JIA Jin-chao, ZHANG Hai-fang, FENG Ming-de, YANG Bai-yu, LI Jun-sheng. Determination of optimum positions of incident spherical wave and reference spherical wave in testing aspheric surface[J].Chinese Optics, 2012, 5(3): 263-269.doi:10.3788/CO.20120503.0263

Determination of optimum positions of incident spherical wave and reference spherical wave in testing aspheric surface

doi:10.3788/CO.20120503.0263
  • Received Date:13 Feb 2012
  • Rev Recd Date:23 Apr 2012
  • Publish Date:10 Jun 2012
  • To test an aspheric surface with an interference way in high-precision, a new method for determining the optimum positions of incident spherical wave source and reference spherical wave source are proposed. The optimal position of incident spherical wave source is determined by calculating the interferometric fringe density between incident spherical wave and aspherical reflective wave and that of the reference spherical wave source is obtained from calculating the interferometric fringe density on a CCD. On the theoretical basis of this research, the specific strategies of selecting CCDs and optical components can be determined and the interferogram can be fully analyzed to get much information about tested aspheric surfaces. It is shown that the research results can be used for theoretically guiding the debugging process of testing aspheric surfaces.

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